AEHR News

Aehr Test Systems and ISE Labs Announce Partnership on Wafer-Level Test and Burn-in for High-Performance Computing and Artificial Intelligence Processors

Aehr Test Systems Reports Fiscal 2026 First Quarter Financial Results; Strong AI and Data Center-Related Semiconductor Test and Burn-in Activity Underscores Multi-Year Market Opportunity

Aehr Test Systems to Announce First Quarter Fiscal 2026 Financial Results on October 6, 2025

Aehr Test Systems to Participate in 17th Annual CEO Investor Summit 2025 in Phoenix, AZ

Aehr Test Systems Announces Wafer Level Burn-in and Test Application Evaluation Order from Leading AI Processor Supplier

Major Hyperscaler Expands AI Processor Production Capacity with Additional Aehr Test Package-Level Test and Burn-in Systems

Aehr Test Systems to Participate in the Needham Virtual Semiconductor and SemiCap 1x1 Conference on August 20

Aehr Test Systems to Participate in the Jefferies Semiconductor, IT Hardware & Communications Technology Conference on August 26, 2025